Titan Cs Probe is equipped with HR - TEM, HR - STEM, EDX analysis and high energy resolution EELS with monochromator. It is capabile of performing BF/DF imaging; Cs probe corrected high resolution STEM imaging of samples with high contrast; high resolution TEM imaging of samples with high contrast EFTEM imaging; fast EELS STEM spectrum imaging; DPC of magnetic samples; monochromated STEM/TEM at high/low accelerating voltages; TEM/STEM tomography of samples; and electron diffraction. Point resolution: 0.08 nm, information limit: 0.1 nm, EFTEM resolution: 1 nm, STEM-resolution: 0.08 nm, electron tomography resolution: 1 nm. Lorentz TEM and Fast EELS STEM spectrum imaging. Magnetic samples can be analyzed (DPC and holography) with this microscope.
|Name||Transmission electron microscope - Titan Cs Probe|