Scanning electron microscope - SEM - that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition. This is is an ultra-high resolution field emission SEM with UniColor (UC) technology, 2-mode final lens (immersion and field-free), SE/BSE in-lens detection, a solid state concentric backscatter (CBS) detector and beam deceleration capability. Combined, these features help maximize resolution, surface detail and contrast at very low voltages. The EDS attachment allows for elemental identification/localization.
|Name||Scanning Electron Microscope - Magellan SEM|
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