FEI Quanta3D FEG SEM/FIB

    Gheorghe Iordache (Manager)

Equipment/facility: Equipment

  • Location

    King Abdullah University of Science and Technology Thuwal 23955

    Saudi Arabia

Equipments Details

Description

Scanning Electron Microscope / Focused Ion Beam for SEM imaging,  fast composition analysis, micro milling, Pt deposition of small sample.
Model: Quanta 3D FEG
Photo associated with equipment

Details

NameFEI Quanta3D FEG SEM/FIB
Acquisition date04/1/10
ManufacturersFEI Company

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